Inspection and Metrology: New Solutions for Semiconductor Industry
The semiconductor and semiconductor like industries continue to produce ever smaller devices that are more complex in both shape and materials. For these purposes, Marposs has a complete range of non-contact sensors used for thin-film metrology, wafer dimensional characterization, wafer inspection and packaging inspection. Our sensors can work inside automatic inspection machines to find defects and dimensional variation.
In-Line Leak testing: Advanced industrial solution for Appliances
In the context of the White Goods/Home Appliances industry, Marposs Dryer Heat Pump Leak Test application is a high-tech end-of-line test that allows the manufacturer to guarantee very high quality in its final product, without sacrificing the high productivity it must maintain to meet market demand with actual production sites.